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Extreme resolution 3D X-ray for advanced packaging

A commercial GPU with HBM is analysed using the Excillum NanoTube N3 X-ray source in…

Sharper scans, faster ramp-up

How a leap forward in X-ray resolution can drive development and boost yield in advanced…

Enabling battery quality at scale via high-throughput CT

Peter Attia, cofounder and CTO of Glimpse, discusses the challenges and opportunities to enable battery…

Revolutionizing EV battery production with advanced CT scanning technology

Two Tesla veterans, Peter Attia and Eric Moch, co-founders of Glimpse, recognized a pressing challenge…

Brightness as key performance metric
for X-ray tubes and benchtop X-ray sources

Download our latest white paper where we define the terminology and illustrate why brightness is…

Laboratory High-Contrast X-ray Microscopy of Copper Nanostructures Enabled by a Liquid-Metal-Jet X-ray Source

Kristina Kutukova, Bartlomiej Lechowski, Joerg Grenzer, Peter Krueger, André Clausner, and Ehrenfried Zschech Nanomaterials 2024,…

Laboratory X-ray Microscopy of 3D Nanostructures in the Hard X-ray Regime Enabled by a Combination of Multilayer X-ray Optics

Bartlomiej Lechowski, Kristina Kutukova, Joerg Grenzer, Iuliana Panchenko, Peter Krueger, Andre Clausner and Ehrenfried Zschech.…

Observation of Néel-type skyrmions in acentric self-intercalated Cr1+δTe2

Rana Saha, Holger L. Meyerheim, Börge Göbel, Binoy Krishna Hazra, Hakan Deniz, Katayoon Mohseni, Victor…

Van der Waals epitaxy growth of 2D ferromagnetic Cr(1+δ)Te2 nanolayers with concentration-tunable magnetic anisotropy

Kinga Lasek, Paula M. Coelho, Pierluigi Gargiani, et al. Appl. Phys. Rev. 9, 011409 (2022)…

Atomic Displacements Enabling the Observation of the Anomalous Hall Effect in a Non-Collinear Antiferromagnet

Berthold H. Rimmler, Binoy K. Hazra, Banabir Pal, Katayoon Mohseni, James M. Taylor, Amilcar Bedoya-Pinto,…

Magnetic Skyrmions in a Thickness Tunable 2D Ferromagnet from a Defect Driven Dzyaloshinskii–Moriya Interaction

Anirban Chakraborty, Abhay K. Srivastava, Ankit K. Sharma, Ajesh K. Gopi, Katayoon Mohseni, Arthur Ernst,…

High resolution molecular structure determination: Complementarity of single crystal X-ray and electron diffraction techniques

Utilizing the complementarity of electron and X-ray diffraction methods opens up possibilities for home labs…