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Publications

Laminography: A non-destructive 3D X-ray breakthrough for advanced packaging

Till Dreier and Julius Hållstedt, for 3DInCites, October 2025.
Publications

Discover the world’s fastest industrial CT scanner

Peter Attia, Glimpse; Emil Espes, Excillum; Christian Gück, VCbattery.
Webinars

How much value can the “Superscanner” unlock for the battery industry? Hint: It’s not just about pass/fail!

Excillum, VCbattery, and Glimpse review the various value streams that high-throughput, in-line CT scanning unlocks…
Webinars

Designing a “Superscanner” for high-throughput battery QC: Technical overview of the world’s fastest industrial CT scanner

Excillum, VCbattery, and Glimpse discuss how we designed and built the world’s fastest industrial CT…
Videos

A revolution in battery inspection

Excillum, VCbattery and Glimpse join forces and presents the Superscanner - a revolution in battery…
Publications

Exploring image quality improvements in high-speed dual threshold photon-counting micro-CT

Till Dreier & Jenny Romell, Excillum; Carlo Amato & Spyridon Gkoumas, DECTRIS.
Publications

The perfect match of 24 keV MetalJet and CdTe HPC detectors

Julius Hållstedt, Excillum; Sofia Trampari & Marcus Müller, DECTRIS.
Publications

Revealing the invisible: Optimized nano-CT case studies in advanced packaging

Till Dreier and Julius Hållstedt, for 3DInCites, July 2025.
Press releases

Excillum acquires Exciscope

July 8, 2025 - Excillum acquires Exciscope and gets access to intellectual property, X-ray system…
Press releases

Excillum and Royma enhance battery inspection with inline CT

May 27, 2025 - Excillum and Royma partner to further increase inspection speed and accuracy.
Press releases

Excillum and Baker Hughes’ Waygate Technologies announce technology collaboration for high-resolution X-ray computed tomography

May 6, 2025 - Excillum and Baker Hughes' Waygate Technologies today announced a technology collaboration.
Publications

Taking three-dimensional x-ray diffraction (3DXRD) from the synchrotron to the laboratory scale

Seunghee Oh, Yuefeng Jin, Sangwon Lee, Wenxi Li, Ken Geauvreau, Matthew Williams, Robert Drake &…