Spectroscopy/Fluorescence

Spectroscopic X-ray methods build on the dependence on X-ray energy. This dependence can be used to identify elements, since every element has its unique absorption edges and fluorescence lines. This provides a way to detect most elements in the periodic table even inside an object and at very low concentrations. X-ray spectroscopy and fluorescence is used in many fields, such as material science, biology, forensics, environmental science and industrial applications.

Features and Benefits

The MetalJet D2+ is the latest generation of Excillum’s patented, high-brilliance micro-focus X-ray source. The MetalJet uses a fast-flowing liquid jet of metal instead of a solid anode metal target, thereby allowing a greater power loading to be placed on the metal target. The high-speed jet efficiently transports heat away from the interaction point and quickly regenerates the alloy. In this way, the MetalJet can generate a much higher-brilliance than conventional solid anode X-ray tubes.

You can read more about the MetalJet Technology here and find our entire MetalJet product range here!

Extreme microfocus source power, with ~10x higher brilliance than conventional microfocus X-ray tubes
Small, adjustable and well-defined X-ray spot
Stable X-ray emission and spot position, which is essential for long-time measurements
User-friendly Graphical User Interface with remote control through TCP/IP protocol for full control of source settings
User selectable e-beam size and position on the metal-jet enables variable take-off angle, to adjust X-ray spot size, flux and spectrum hardness
Advanced e-beam technology and algorithm for internal absolute spot size calibration in micrometers
Unique target material enables the use of characteristic lines
Optional dual-port mode, enables two setups from the same source

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Affiliation

Hard Energy X-ray photoelectron Spectroscopy (HAXPES)

HAXPES-Lab is designed to allow hard X-ray photoelectron spectroscopy (HAXPES) measurements in standard lab environments and offers the unique possibility to investigate bulk properties of various materials, analyse buried interfaces and access deep core levels.

Photoelectron spectroscopy (XPS) is an ideal tool to probe the chemical state of a material and as such it is becoming ever more used to investigate electronic structures of various solid materials in the bulk, on surfaces as well as at buried interfaces. A home laboratory facility that probes bulk and buried interfaces has up until now not been commercially available.

To read more about this product, please visit our partner Scienta Omicron!

Related publications

Example

Results – Ga Kα lab source on Si – Providing an XPS window to the bulk!

Si 1s spectra from native silicon (typ. 1 monolayer) and silicon with 50nm silicon oxide layer
Elemental Si bulk peak and Silicon oxide surface peak clearly visible

Due to the large penetration
depth of Ga Kα, the metal
silicon peak is visible
through 50nm SiO₂

Image and example courtesty of Susanna Eriksson at Scienta Omicron.
AIP 2017 Review of Scientific Instruments Volume 89, Issue 7 10.1063/1.5039829, A Regoutz, M Mascheck, T Wiell, S K. Eriksson, C Liljenberg, K Tetzner, B A. D. Williamson, D O. Scanlon, and P Palmgren