March 26, 2026
Decision-quality fast CT for battery inspection
Steffen Masuch and Klaus Dröder, TU Braunschweig; and Sophie Gräfnitz, PowerCo.
December 2, 2025
Extremely high-speed X-ray radiography at micrometer resolution to reveal hidden dynamics for failure and root cause analysis of electronics
Julius Hållstedt, Emil Espes, Till Dreier, and Daniel Nilsson, Excillum; Spyridon Gkoumas, DECTRIS Ltd.
October 1, 2025
Discover the world’s fastest industrial CT scanner
Peter Attia, Glimpse; Emil Espes, Excillum; Christian Gück, VCbattery.
August 25, 2025
Exploring image quality improvements in high-speed dual threshold photon-counting micro-CT
Till Dreier and Jenny Romell, Excillum; Carlo Amato and Spyridon Gkoumas, DECTRIS.
August 18, 2025
The perfect match of 24 keV MetalJet and CdTe HPC detectors
Julius Hållstedt, Excillum; Sofia Trampari and Marcus Müller, DECTRIS.
April 29, 2025
Taking three-dimensional x-ray diffraction (3DXRD) from the synchrotron to the laboratory scale
Seunghee Oh, Yuefeng Jin, Sangwon Lee, Wenxi Li, Ken Geauvreau, Matthew Williams, Robert Drake &…
April 11, 2025
Fast and high-resolution X-ray nano tomography for failure analysis in advanced packaging
Till Dreier, Daniel Nilsson and Julius Hållstedt Science Direct, Microelectronics Reliability, Volume 168, May 2025,…
