Publications Archives

Publications

December 2, 2025

Extremely high-speed X-ray radiography at micrometer resolution to reveal hidden dynamics for failure and root cause analysis of electronics

Julius Hållstedt, Emil Espes, Till Dreier, and Daniel Nilsson, Excillum; Spyridon Gkoumas, DECTRIS Ltd.

Ingrid Aksnes

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Publications

October 8, 2025

Laminography: A non-destructive 3D X-ray breakthrough for advanced packaging

Till Dreier and Julius Hållstedt, for 3DInCites, October 2025.

Ingrid Aksnes

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Publications

October 1, 2025

Discover the world’s fastest industrial CT scanner

Peter Attia, Glimpse; Emil Espes, Excillum; Christian Gück, VCbattery.

Ingrid Aksnes

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Publications

August 25, 2025

Exploring image quality improvements in high-speed dual threshold photon-counting micro-CT

Till Dreier and Jenny Romell, Excillum; Carlo Amato and Spyridon Gkoumas, DECTRIS.

Ingrid Aksnes

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Publications

August 18, 2025

The perfect match of 24 keV MetalJet and CdTe HPC detectors

Julius Hållstedt, Excillum; Sofia Trampari and Marcus Müller, DECTRIS.

Ingrid Aksnes

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Publications

August 18, 2025

Revealing the invisible: Optimized nano-CT case studies in advanced packaging

Till Dreier and Julius Hållstedt, for 3DInCites, July 2025.

Ingrid Aksnes

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Publications

April 29, 2025

Taking three-dimensional x-ray diffraction (3DXRD) from the synchrotron to the laboratory scale

Seunghee Oh, Yuefeng Jin, Sangwon Lee, Wenxi Li, Ken Geauvreau, Matthew Williams, Robert Drake &…

Ingrid Aksnes

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Publications

April 28, 2025

Unlocking the mystery of X-ray imaging for electronics and semiconductor inspection

Till Dreier and Julius Hållstedt, for 3DInCites, April 2025.

Ingrid Aksnes

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Publications

April 11, 2025

Fast and high-resolution X-ray nano tomography for failure analysis in advanced packaging

Till Dreier, Daniel Nilsson and Julius Hållstedt Science Direct, Microelectronics Reliability, Volume 168, May 2025,…

Ingrid Aksnes

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Publications

March 1, 2024

Brightness as key performance metric
for X-ray tubes and benchtop X-ray sources

Download our latest white paper where we define the terminology and illustrate why brightness is…

Ingrid Aksnes

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Publications

Extremely high-speed X-ray radiography at micrometer resolution to reveal hidden dynamics for failure and root cause analysis of electronics

Laminography: A non-destructive 3D X-ray breakthrough for advanced packaging

Discover the world’s fastest industrial CT scanner

Exploring image quality improvements in high-speed dual threshold photon-counting micro-CT

The perfect match of 24 keV MetalJet and CdTe HPC detectors

Revealing the invisible: Optimized nano-CT case studies in advanced packaging

Taking three-dimensional x-ray diffraction (3DXRD) from the synchrotron to the laboratory scale

Unlocking the mystery of X-ray imaging for electronics and semiconductor inspection

Fast and high-resolution X-ray nano tomography for failure analysis in advanced packaging

Brightness as key performance metric
for X-ray tubes and benchtop X-ray sources

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