Researchers at the University of Hong Kong determined the crystal structure of a tiny crystal of C23H14F3N3ORh·CF3O3S using a Bruker Diffractometer with MetalJet mounted, using Ga Kα, radiation (λ = 1.34138Å).
Related Posts

The perfect match of 24 keV MetalJet and CdTe HPC detectors
Julius Hållstedt, Excillum; Sofia Trampari, DECTRIS; Marcus Müller, DECTRIS.
Ingrid AksnesAugust 18, 2025

Revealing the invisible: Optimized nano-CT case studies in advanced packaging
Till Dreier and Julius Hållstedt, for 3DInCites, July 2025.
Ingrid AksnesAugust 18, 2025

Unlocking the mystery of X-ray imaging for electronics and semiconductor inspection
Till Dreier and Julius Hållstedt, for 3DInCites, April 2025.
Ingrid AksnesApril 28, 2025