In Situ X-Ray Reciprocal Space Mapping for Characterization of Nanomaterials

January 2016 – Chapter from X-ray and Neutron Techniques for Nanomaterials Characterization, pp 507-544 – Peter Siffalovic, Karol Vegso, Martin Hodas, Matej Jergel, Yuriy Halahovets, Marco Pelletta, Dusan Korytar, Zdeno Zaprazny, Eva Majkova

This book chapter presents a thorough introduction to SAXS and GISAXS starting with the mathematical foundation. It gives a review of state-of-the-art instrumentation describing x-ray sources, optics, and detectors, explaining how the metal-jet technology has opened up the possibility to perform time-resolved in-situ studies of weakly scattering materials. Two time-resolved applications are described in more detail to show the current research front.

Link to chapter in PDF here.

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